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Technical Papers Published in 1995

Power Bus Decoupling on Multilayer Printed Circuit Boards
T. H. Hubing, J. L. Drewniak, T. P. Van Doren, and D. Hockanson
IEEE Transactions on Electromagnetic Compatibility
vol. EMC-37, no. 2, May 1995, pp. 155-166.

Diagnosing and Modeling Common-Mode Radiation from Printed Circuit Boards with Attached Cables
J. L. Drewniak, F. Sha, T. H. Hubing, T. P. Van Doren, and J. Shaw
Proceedings of the 1995 IEEE International Symposium on Electromagnetic Compatibility
Atlanta, GA, August 1995, pp. 465-470.

An Experimental Investigation of 4-Layer Printed Circuit Board Decoupling
T. H. Hubing, T. P. Van Doren, F. Sha, J. L. Drewniak, and M. Wilhelm
Proceedings of the 1995 IEEE International Symposium on Electromagnetic Compatibility
Atlanta, GA, August 1995, pp. 308-312.

FDTD Modeling of Thin Wires for Simulating Common-Mode Radiation from Structures with Attached Cables
D. M. Hockanson, J. L. Drewniak, T. H. Hubing, and T. P. Van Doren
Proceedings of the 1995 IEEE International Symposium on Electromagnetic Compatibility
Atlanta, GA, August 1995, pp. 168-173.

Integrating EMC Laboratory Exercises into Undergraduate Electromagnetics
J. L. Drewniak, T. H. Hubing, T. P. Van Doren, and F. Sha
Proceedings of the 1995 IEEE International Symposium on Electromagnetic Compatibility
Atlanta, GA, August 1995, pp. 35-40.

Determining and Modeling Radiated Emissions from High-Speed Designs
J. L. Drewniak, T. H. Hubing, and T. P. Van Doren
Proceedings of the 1995 Progress In Electromagnetics Research Symposium
Seattle, WA, July 1995

Shielding Enclosure Radiation Enhancement Due to Attached Cables
D. M. Hockanson, J. L. Drewniak, T. H. Hubing, and T. P. Van Doren
presented at the IEEE APS Int. Symposium and URSI Radio Science Mtg
Newport Beach, CA, June 1995.

EMI Sources Resulting from Finite Impedance Reference Structures
J. L. Drewniak, T. H. Hubing, T. P. Van Doren, Sha Fei, and J. D. Shaw
presented at the IEEE APS Int. Symposium and URSI Radio Science Mtg
Newport Beach, CA, June 1995.

Stop that Noise: EMI-Frustrating for Many; a Rewarding Career for a Few
T. Van Doren, T. Hubing, J. Drewniak, F. Sha, and D. Hockanson
IEEE Potentials
vol. 14, no. 4, Oct./Nov. 1995, pp. 35-39.