Todd Hubing Photo

Technical Papers Published in 2005

Model for Estimating Radiated Emissions from a Printed Circuit Board with Attached Cables Driven by Voltage-Driven Sources
H. Shim and T. Hubing
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 4, Nov. 2005, pp. 899-907.

Derivation of a Closed-Form Expression for the Self-Capacitance of a Printed Circuit Board Trace
H. Shim and T. Hubing
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 4, Nov. 2005, pp. 1004-1008.

A Modified LU Recombination Method for Improving the Performance of Boundary Element Methods at Low Frequencies
H. Ke and T. Hubing
Journal of the Applied Computational Electromagnetics Society
vol. 20, no. 3, Nov. 2005, pp. 178-185.

Effective Preconditioners for the Solution of Hybrid FEM/MoM Matrix Equations using Combined Formulations
C. Guo and T. Hubing
Journal of the Applied Computational Electromagnetics Society
vol. 20, no. 2, July 2005, pp. 96-106.

Traces in Proximity to Gaps in Return Planes
T. Zeeff, T. Hubing and T. Van Doren
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 2, May 2005, pp. 388-392.

Analysis of a Low-Pass Filter Employing a 4-Pin Capacitor
T. Zeeff, A. Ritter, T. Hubing and T. Van Doren
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 1, Feb. 2005, pp. 202-205.

Analytical Model for the Rectangular Power-Ground Structure Including Radiation Loss
Richard L. Chen, Ji Chen, Todd H. Hubing and Weimin Shi
IEEE Transactions on Electromagnetic Compatibility
vol. 47, no. 1, Feb. 2005, pp. 10-16.

A Brief History of EMC Education
T. Hubing and A. Orlandi
Proc. of the 16th International Zurich Symp. and Technical Exhibition on EMC
Zurich, Switzerland, Feb. 2005, pp. 95-97.

Effective Strategies for Choosing and Locating Printed Circuit Board Decoupling Capacitors
T. Hubing
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 632-637.

Neural Network Detection and Identification of Electronic Devices Based on their Unintended Emissions
H. Weng, X. Dong, X. Hu, D. Beetner, T. Hubing and D. Wunsch
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 245-249.

Using an LU Recombination Method to Improve the Performance of the Boundary Element Method at Very Low Frequencies
H. Ke and T. Hubing
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 442-445.

Determination of High Frequency Package Currents from Near-Field Scan Data
X. Dong, S. Deng, D. Beetner, T. Hubing and T. Van Doren
Proc. of the 2005 IEEE International Symposium on Electromagnetic Compatibility
Chicago, IL, USA, August 2005, pp. 679-683.

Application of Transmission Line Models to Backpanel Plated Through-hole Via Design
S. Deng, J. Fan, J. Knighten, T. Hubing, J. Drewniak and N. Smith
Proc. of IEEE 14th Topical Meeting on Electrical Perform. of Electronic Packag. (EPEP 2005)
Austin, Texas, Oct. 2005, pp. 99-102.